JPH0129021B2 - - Google Patents
Info
- Publication number
- JPH0129021B2 JPH0129021B2 JP57110408A JP11040882A JPH0129021B2 JP H0129021 B2 JPH0129021 B2 JP H0129021B2 JP 57110408 A JP57110408 A JP 57110408A JP 11040882 A JP11040882 A JP 11040882A JP H0129021 B2 JPH0129021 B2 JP H0129021B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- einzel lens
- sample surface
- lens
- ion beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 27
- 238000010884 ion-beam technique Methods 0.000 claims description 16
- 230000003287 optical effect Effects 0.000 claims description 7
- 238000010586 diagram Methods 0.000 description 7
- 230000004075 alteration Effects 0.000 description 5
- 238000000605 extraction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 229910001338 liquidmetal Inorganic materials 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/12—Lenses electrostatic
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57110408A JPS59838A (ja) | 1982-06-26 | 1982-06-26 | フオ−カスイオンビ−ム装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57110408A JPS59838A (ja) | 1982-06-26 | 1982-06-26 | フオ−カスイオンビ−ム装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59838A JPS59838A (ja) | 1984-01-06 |
JPH0129021B2 true JPH0129021B2 (en]) | 1989-06-07 |
Family
ID=14535021
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57110408A Granted JPS59838A (ja) | 1982-06-26 | 1982-06-26 | フオ−カスイオンビ−ム装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59838A (en]) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2763529B2 (ja) * | 1986-09-02 | 1998-06-11 | 松下電器産業株式会社 | 電子楽器 |
JP2763530B2 (ja) * | 1986-09-03 | 1998-06-11 | 松下電器産業株式会社 | 電子楽器 |
JPH0740189B2 (ja) * | 1986-10-24 | 1995-05-01 | カシオ計算機株式会社 | タツチレスポンス装置 |
JPH0722716Y2 (ja) * | 1987-05-15 | 1995-05-24 | カシオ計算機株式会社 | タッチレスポンス装置 |
JP2764961B2 (ja) * | 1988-11-18 | 1998-06-11 | ヤマハ株式会社 | 電子楽器 |
JP3968338B2 (ja) | 2003-10-08 | 2007-08-29 | 株式会社東芝 | 荷電ビーム露光装置 |
US7880147B2 (en) * | 2008-01-24 | 2011-02-01 | Perkinelmer Health Sciences, Inc. | Components for reducing background noise in a mass spectrometer |
-
1982
- 1982-06-26 JP JP57110408A patent/JPS59838A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59838A (ja) | 1984-01-06 |
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